X-ray residual stress measurement of sintered Si3N4.
نویسندگان
چکیده
منابع مشابه
Depth-resolved residual stress evaluation from X-ray diffraction measurement data using the approximate inverse method
The paper deals with the depth determination of residual stress states from diffraction data. First an historical overview of the known approaches is given. Then we apply the approximate inverse method to this problem. This method is known to be very efficient and stable with respect to noise-contaminated data. It is even possible to prove convergence and it allows an error estimate of the calc...
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Indentation is a new method for estimating residual stress. The plastic behavior of the materials under study can affect indentation parameters and, thus, influences the results of residual stress measurement. In this paper, the effect of yield stress and work-hardening exponent on the accuracy of residual stress measurements in steels and aluminums was studied. Results showed that, for m...
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1. ABSTRACT X-ray diffraction (XRD) measurements have been made to determine residual stresses in embedded Al particles placed between the first and second ply of both unidirectional and fabric graphite/PMR-15 composite specimens. In order to further verify the results obtained, the effect of externally applied four-point bending on the measured strains and stresses in the Al inclusions was inv...
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ژورنال
عنوان ژورنال: Journal of the Society of Materials Science, Japan
سال: 1987
ISSN: 1880-7488,0514-5163
DOI: 10.2472/jsms.36.810